Determination of Funnel Length from Cross Section versus LET Measurements

IEEE Transactions on Nuclear Science

Volumn 40, Issue 6, 1993, Pages 1910-1917

  Golke, Keith W ^a  

^a HONEYWELL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC CHARGE; MATHEMATICAL MODELS; SUBSTRATES; SURFACE PHENOMENA;

CHARGE COLLECTION; CRITICAL CHARGE; EPI LAYER; FUNNEL LENGTH; HEAVY ION UPSET; LINEAR ENERGY TRANSFER; MINORITY CARRIERS;

IONS;

EID: 0027809064     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273464     Document Type: Article

References (4)

1. T. R. Oldham, F. B. McLean, “Charge Collection Measurements for Heavy Ions Incident on n- and p-Type Silicon,” IEEE Trans. Nucl. Sci., vol. NS-30, no. 6, pp. 4493–4499, December 1983.
2. E. L. Petersen, J. C. Pickel, J. H. Adams, E. C. Smith, “Rate Prediction for Single Event Effects - a Critique,” IEEE Trans. Nucl. Sci., vol. 39, no. 6, pp. 1577–1599, December 1992.
3. P. J. McNulty, W. J. Beauvis, D. R. Roth, “Determination of SEU Parameters of NMOS and CMOS SRAMs,” IEEE Trans. Nucl. Sci., vol. 38, no. 6, pp. 1463–1470, December 1991.
4. E. L. Petersen, J. C. Pickel, E. C. Smith, P. J. Rudeck, J. R. Letaw, “Geometrical Factors in SEE Rate Calculations,” Presented at NSREC, July 1993.