Bevalac ion beam characterizations for single event phenomena

IEEE Transactions on Nuclear Science

Volumn 37, Issue 6, 1990, Pages 1923-1928

  Koga, R ^a   Katz, N ^a   Pinkerton, S D ^a   Kolasinski, W A ^a   Oberg, D L ^b  

^a AEROSPACE CORPORATION   (United States)

^b BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATORS; ION BEAMS;

BEVALAC; LINEAR ENERGY TRANSFER; SINGLE EVENT PHENOMENA;

MICROELECTRONICS;

EID: 0025595671     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.101210     Document Type: Article

References (7)

1. TL Criswell, PR Measel and KL Wahlin, “Single Event Upset Testing with Relativistic Heavy Ions,” IEEE Trans. Nucl. Sci., NS-31, pp. 1559–1563, 1984.
2. TL Criswell, DL Oberg, JL Wert, PR Measel, and WE Wilson, “Measurement of SEU Thresholds and Cross Sections at Fixed Incident Angles,” IEEE Trans. Nucl. Sci., NS-34, pp. 1316–1321, 1987.
3. DL Oberg and JL Wert, “First Nondestructive Measurements of Power MOSFET Single Event Burnout Cross Sections,” IEEE Trans. Nucl. Sci., NS-34, pp. 1736–1741, 1987.
4. WI Stapor, PT McDonald, AR Knudson, AB Campbell, and BG Glagola, “Charge Collection on Silicon for Ions of Different Energy but Same Linear Energy Transfer (LET),” IEEE Trans. Nucl. Sci., NS-35, pp. 1585–1590, 1988.
5. RL Fleischer, PB Price, and RM Walker, Nuclear Tracks in Solids, University of California Press, Berkeley, p. 27, 1975.
6. M Shoga, P Adams, DL Chennette, R Koga, and EC Smith, “Verification of Single Event Upset Rate Estimation Methods with On-orbit Observations,” IEEE Trans. Nucl. Sci., NS-34, pp. 1256–1261, 1987.
7. AW Koehler “Dosimetry of Proton Beams Using Small Silicon Diodes,” Radiation Research Supplement, vol. 7, pp. 53–63, 1967.