Heavy ion induced upsets in semiconductor devices

IEEE Transactions on Nuclear Science

Volumn 32, Issue 1, 1985, Pages 159-162

  Koga, R ^a   Kolasinski, W A ^a   Imamoto, S ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATORS; COSMIC RAYS; IONS; SEMICONDUCTOR DEVICE TESTING;

HEAVY ION INDUCED UPSETS; LSI 11/23 COMPUTER; SPACE RADIATION EFFECTS;

SEMICONDUCTOR DEVICES;

EID: 0021373121     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1985.4336812     Document Type: Article

References (2)

1. Koga, R. and W.A. Kolasinski, “Heavy Ion-Induced Single Event Upsets of Microcircuits: A Summary of the Aerospace Corporation Test Data,” IEEE Trans. Nuc. Sci., NS-31, 1984.
2. Shapiro, P., E. L. Petersen and J. H. Adams, Jr.