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Volumn 37, Issue 6, 1990, Pages 1916-1922

A new method for using 252Cf in SEU testing

Author keywords

[No Author keywords available]

Indexed keywords

CALIFORNIUM; RADIATION EFFECTS;

EID: 0025658658     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.101209     Document Type: Article
Times cited : (9)

References (14)
  • 1
    • 84941446344 scopus 로고
    • Single Event Upsets in Microelectronics: Third Cosmic Ray Upset Experiment
    • E. R. Berger, M. House, G. Manzo and A. H. Taber, “Single Event Upsets in Microelectronics: Third Cosmic Ray Upset Experiment,” IBM Technical Directions, Vol. 11, No. 1, p. 33 (1985).
    • (1985) IBM Technical Directions , vol.11 , Issue.1 , pp. 33
    • Berger, E.R.1    House, M.2    Manzo, G.3    Taber, A.H.4
  • 2
    • 0021635963 scopus 로고
    • A Comparison Of Heavy Ion Sources Used In Cosmic Ray Simulation Studies Of VLSI Circuits
    • J. H. Stephen, T. K. Sanderson, D. Mapper and J. Farren, “A Comparison Of Heavy Ion Sources Used In Cosmic Ray Simulation Studies Of VLSI Circuits,” IEEE Trans. Nucl. Sci., Vol. NS-31, No. 6, p. 1069 (1984).
    • (1984) IEEE Trans. Nucl. Sci. , vol.NS-31 , Issue.6 , pp. 1069
    • Stephen, J.H.1    Sanderson, T.K.2    Mapper, D.3    Farren, J.4
  • 3
    • 0025257864 scopus 로고
    • Single-Event Correlation Between Heavy Ions And Cf-252 Fission Fragments
    • J. S. Browning, “Single-Event Correlation Between Heavy Ions And Cf-252 Fission Fragments,” Nucl. Instr. and Meth., Vol. B45, p. 714 (1990).
    • (1990) Nucl. Instr. and Meth. , vol.B45 , pp. 714
    • Browning, J.S.1
  • 4
    • 0022241801 scopus 로고
    • Use Of Cf-252 To Determine Parameters For SEU Rate Calculation
    • J. T. Blandford and J. C. Pickel, “Use Of Cf-252 To Determine Parameters For SEU Rate Calculation,” IEEE Trans. Nucl. Sci., Vol. NS-32, No. 6, p. 4282 (1985).
    • (1985) IEEE Trans. Nucl. Sci. , vol.NS-32 , Issue.6 , pp. 4282
    • Blandford, J.T.1    Pickel, J.C.2
  • 5
    • 84939014032 scopus 로고
    • SEU Measurements Using 252 Cf Fission Particles, On CMOS Static Rams, Subjected To A Continuous Period Of Low Dose Rate 60 Co Irradiation
    • T. K. Sanderson, D. Mapper, J. H. Stephen, and J. Farren, “SEU Measurements Using 252 Cf Fission Particles, On CMOS Static Rams, Subjected To A Continuous Period Of Low Dose Rate 60 Co Irradiation,” IEEE Trans. Nucl. Sci., Vol. NS-34, No. 6, p. 1287 (1987).
    • (1987) IEEE Trans. Nucl. Sci. , vol.NS-34 , Issue.6 , pp. 1287
    • Sanderson, T.K.1    Mapper, D.2    Stephen, J.H.3    Farren, J.4
  • 7
    • 84943459213 scopus 로고
    • An Improved Cf Single-Event-Upset Upset Simulation Technique for Testing Microelectronics
    • R. C. Block and M. Becker, “An Improved Cf Single-Event-Upset Upset Simulation Technique for Testing Microelectronics,” Trans. Am. Nucl. Soc., Vol. 54, p. 18, (1987).
    • (1987) Trans. Am. Nucl. Soc. , vol.54 , pp. 18
    • Block, R.C.1    Becker, M.2
  • 8
    • 46149131742 scopus 로고
    • Response Characteristics Of Thin Film Detectors To Fission Fragments
    • I. Kanno and Y. Nakagome, “Response Characteristics Of Thin Film Detectors To Fission Fragments,” Nucl. Instr. and Meth., Vol. A251, p. 108 (1986)
    • (1986) Nucl. Instr. and Meth. , vol.A251 , pp. 108
    • Kanno, I.1    Nakagome, Y.2
  • 10
    • 0000535202 scopus 로고
    • Precision Measurements Of Correlated Energies and Velocities Of 252 Cf Fission Fragments
    • H. W. Schmitt, W. E. Kiker, and C. W. Williams, “Precision Measurements Of Correlated Energies and Velocities Of 252 Cf Fission Fragments,” Phys. Rev., Vol. 137, p. B837 (1965).
    • (1965) Phys. Rev. , vol.137 , pp. B837
    • Schmitt, H.W.1    Kiker, W.E.2    Williams, C.W.3
  • 12
    • 84943460342 scopus 로고    scopus 로고
    • JPL, (Private Communication)
    • D. K. Nichols, JPL, (Private Communication).
    • Nichols, D.K.1
  • 14
    • 0024902710 scopus 로고
    • Characterization Of A Hardened CMOS 64k and 256k SRAM
    • F. W. Sexton, J. S. Fu, R. A. Kohler, and R. Koga, “Characterization Of A Hardened CMOS 64k and 256k SRAM,” IEEE Trans. Nucl. Sci., Vol. NS-36, No. 6, p. 2311 (1989).
    • (1989) IEEE Trans. Nucl. Sci. , vol.NS-36 , Issue.6 , pp. 2311
    • Sexton, F.W.1    Fu, J.S.2    Kohler, R.A.3    Koga, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.