Observation of Single Event Upsets in Analog Microcircuits

IEEE Transactions on Nuclear Science

Volumn 40, Issue 6, 1993, Pages 1838-1844

  Koga, R ^a   Pinkerton, S D ^a   Moss, S C ^a   Mayer, D C ^a   LaLumondiere, S ^a   Hansel, S J ^a   Crawford, K B ^a   Crain, W R ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPARATOR CIRCUITS; ELECTRONIC EQUIPMENT TESTING; IONS; OPERATIONAL AMPLIFIERS; SPACE APPLICATIONS; STANDARDS;

ANALOG MICROCIRCUITS; HEAVY ION; MULTIPLE DIFFERENCE AMPLIFIER STAGES; SINGLE EVENT UPSETS;

NETWORKS (CIRCUITS);

EID: 0027810886     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273472     Document Type: Article

References (6)

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