TECHNIQUES OF MICROPROCESSOR TESTING AND SEU-RATE PREDICTION.

IEEE Transactions on Nuclear Science

Volumn NS-32, Issue 6, 1985, Pages

  Koga, R ^a   Kolasinski, W A ^a   Marra, M T ^a   Hanna, W A ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS - RADIATION EFFECTS; SPACECRAFT - COMPUTERS;

SINGLE EVENT UPSET;

COMPUTERS, MICROCOMPUTER;

EID: 0022246890     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)