메뉴 건너뛰기




Volumn 34, Issue 1, 2016, Pages

Effect of hydrogen peroxide pretreatment on ZnO-based metal-semiconductor-metal ultraviolet photodetectors deposited using plasma-enhanced atomic layer deposition

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER DEPOSITION; DEPOSITION; HYDROGEN PEROXIDE; METALLIC FILMS; METALS; OXIDATION; OXIDE FILMS; PEROXIDES; PHOTODETECTORS; PHOTONS; SAPPHIRE; SUBSTRATES; X RAY DIFFRACTION; ZINC; ZINC OXIDE;

EID: 84945186879     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.4933169     Document Type: Article
Times cited : (7)

References (33)
  • 14
    • 0035911611 scopus 로고    scopus 로고
    • S. F. J. Cox et al., Phys. Rev. Lett. 86, 2601 (2001). 10.1103/PhysRevLett.86.2601
    • (2001) Phys. Rev. Lett. , vol.86 , pp. 2601
    • Cox, S.F.J.1
  • 22


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.