|
Volumn 515, Issue 7-8, 2007, Pages 3335-3338
|
Effects of substrate temperature on the microstructure and photoluminescence properties of ZnO thin films prepared by atomic layer deposition
|
Author keywords
Atomic layer deposition; Microstructure; Photoluminescence; X ray diffraction; Zinc oxide
|
Indexed keywords
DEPOSITION;
FILM GROWTH;
MICROSTRUCTURE;
PHOTOLUMINESCENCE;
SCANNING ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
ZINC OXIDE;
ATOMIC LAYER DEPOSITION (ALD)];
CRYSTAL QUALITY;
SEMICONDUCTOR FILMS;
THIN FILMS;
|
EID: 33846939341
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2006.09.007 Document Type: Article |
Times cited : (132)
|
References (15)
|