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ECS Journal of Solid State Science and Technology

Volumn 4, Issue 5, 2015, Pages N30-N35

Ferroelectric hafnium oxide based materials and devices: Assessment of current status and future prospects

(4) Muller J a Polakowski, P a Mueller, S b Mikolajick, T b,c

a FRAUNHOFER INSTITUTE FOR PHOTONIC MICROSYSTEMS (Germany)

b NAMLAB GGMBH (Germany)

c DRESDEN UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84928347019 PISSN: 21628769 EISSN: 21628777 Source Type: Journal
DOI: 10.1149/2.0081505jss Document Type: Article

Times cited : (369)

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