Origin of the dielectric dead layer in nanoscale capacitors

Nature

Volumn 443, Issue 7112, 2006, Pages 679-682

  Stengel, Massimiliano ^a   Spaldin, Nicola A ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; PERMITTIVITY; PEROVSKITE; THIN FILMS;

DIELECTRIC DEAD LAYERS; ELECTROSTATIC SCREENING; NANOSCALE DEVICES;

INTEGRATED CIRCUITS;

NANOPARTICLE; PEROVSKITE; RUTHENIUM DERIVATIVE; STRONTIUM; TITANIUM DIOXIDE;

CURRENT; DIELECTRIC PROPERTY; INSULATION; PEROVSKITE;

AB INITIO CALCULATION; ARTICLE; CAPACITOR; DEVICE; DIELECTRIC CONSTANT; ELECTRIC CAPACITANCE; ELECTRICITY; ELECTRODE; ELECTRONICS; INSULATOR ELEMENT; INTEGRATED CIRCUIT; NANOTECHNOLOGY; PRIORITY JOURNAL;

EID: 33749850301     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature05148     Document Type: Article

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