Surface characterization of nanomaterials and nanoparticles: Important needs and challenging opportunities

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 31, Issue 5, 2013, Pages

  Baer, Donald R ^a   Engelhard, Mark H ^a   Johnson, Grant E ^a   Laskin, Julia ^a   Lai, Jinfeng ^a   Mueller, Karl ^a   Munusamy, Prabhakaran ^a   Thevuthasan, Suntharampillai ^a   Wang, Hongfei ^a   Washton, Nancy ^a   Elder, Alison ^b   Baisch, Brittany L ^b   Karakoti, Ajay ^c   Kuchibhatla, Satyanarayana V N T ^c   Moon, Daewon ^d  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

^c BATTELLE MEMORIAL INSTITUTE   (United States)

^d Daegu Gyeongbuk Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FUNDAMENTAL RESEARCH; MEDIUM ENERGY ION SCATTERING; SECONDARY ION MASS SPECTROSCOPY; SUM FREQUENCY GENERATION; SURFACE AND INTERFACES; SURFACE CHARACTERIZATION; SYNTHESIS AND CHARACTERIZATIONS; TECHNOLOGICAL APPLICATIONS;

AUGER ELECTRON SPECTROSCOPY; CHARACTERIZATION; FREQUENCY SELECTIVE SURFACES; MATERIALS PROPERTIES; NANOSTRUCTURED MATERIALS; RESEARCH; SCANNING PROBE MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SURFACES;

SURFACE PROPERTIES;

EID: 84885106657     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.4818423     Document Type: Review

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