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Volumn 44, Issue 9, 2012, Pages 1305-1308

Application of surface analysis methods to nanomaterials: Summary of ISO/TC 201 technical report: ISO 14187:2011 - Surface chemical analysis - Characterization of nanomaterials

(1) Baer, D R a

a PACIFIC NORTHWEST NATIONAL LABORATORY (United States)

Author keywords

AES; ISO TC201; nanoanalysis; nanomaterials; nanoparticles; SIMS; SPM; surface analysis; XPS

Indexed keywords

AES; ANALYSIS METHOD; ANALYTICAL METHOD; ISO TC201; ISSUES AND CHALLENGES; NANOANALYSIS; NANOPARTICLE SURFACE; SPM; SURFACE ANALYSIS METHODS; SURFACE CHEMICAL ANALYSIS;

AUGER ELECTRON SPECTROSCOPY; LUNAR SURFACE ANALYSIS; NANOPARTICLES; PARTICLE SIZE ANALYSIS; PHOTOELECTRONS; SCANNING PROBE MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SURFACE ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 84865254018 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.4938 Document Type: Article

Times cited : (20)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.