Improving surface-analysis methods for characterization of advanced materials by development of standards, reference data, and interlaboratory comparisons

Surface and Interface Analysis

Volumn 39, Issue 4, 2007, Pages 283-293

  Baer, D R ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Advanced materials analysis; AES; ASTM E42; Auger electron spectroscopy; ISO TC201; Reference data; Surface analysis; Surface standards; X ray photoelectron spectroscopy; XPS

Indexed keywords

ADVANCED MATERIALS ANALYSIS; SURFACE STANDARDS;

AUGER ELECTRON SPECTROSCOPY; MEDICAL APPLICATIONS; NANOPARTICLES; STANDARDIZATION; SURFACE ANALYSIS; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 34147206870     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2508     Document Type: Article

References (13)

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