Nanoparticle-terminated scanning probe microscopy tips and surface samples

Advanced Powder Technology

Volumn 18, Issue 6, 2007, Pages 605-614

  Vakarelski, Ivan U ^a,b   Brown, Scott C ^c   Moudgil, Brij M ^c   Higashitani, Ko ^a  

^a KYOTO UNIVERSITY   (Japan)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c University of Florida   (United States)

Author keywords

AFM; Colloidal Probe; Nanoparticles

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; COATED MATERIALS; LARGE SCALE SYSTEMS; MONOLAYERS; NANOSTRUCTURED MATERIALS; SCANNING;

FLAT SURFACES; GOLD PARTICLES; INDUSTRIAL PROCESSES; INTER PARTICLE SPACING;

NANOPARTICLES;

EID: 36148972084     PISSN: 09218831     EISSN: 15685527     Source Type: Journal    
DOI: 10.1163/156855207782514905     Document Type: Conference Paper

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