XPS MultiQuant: Multimodel XPS quantification software

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 828-832

  Mohai, M ^a  

^a CHEMICAL RESEARCH CENTER   (Hungary)

Author keywords

ESCA; MultiQuant; Quantification; X ray photoelectron spectroscopy; XPS

Indexed keywords

ESCA; INELASTIC MEAN FREE PATHS (IMFP); MULTIQUANT; QUANTIFICATION;

COMPUTER SOFTWARE; CONTAMINATION; CORRELATION METHODS; GEOMETRY; MATHEMATICAL MODELS; PHOTOIONIZATION; SPECTROMETERS; SURFACE CHEMISTRY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 4444223813     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1775     Document Type: Conference Paper

References (23)

1. Varsányi G, Mink G, Rée K, Mohai M. Periodica Polytechnica 1987; 31: 3.
2. Mohai M, Bertóti I. Surf. Interface Anal. 2004; 36: 805.
3. Scofield JH. J. Electron Spectrosc. Relat. Phenom. 1976; 8: 129.
4. Evans S, Pritchard RG, Thomas JM. J. Electron Spectrosc. Relat. Phenom. 1978; 14: 341.
5. Wagner CD, Davis LE, Zeller MV, Taylor JA, Raymond RH, Gale LH. Surf. Interface Anal. 1981; 3: 211.
6. Nefedov VI, Sergushin NP, Band IM, Trzhaskovskaya MB. J. Electron Spectrosc. Relat. Phenom. 1973; 2: 383.
7. Nefedov VI, Sergushin NP, Salyn YV, Band IM, Trzhaskovskaya MB. J. Electron Spectrosc. Relat. Phenom. 1975; 7:175.
8. Reilman RF, Msezane A, Mansor ST. J. Electron Spectrosc. Relat. Phenom. 1976; 8:389.
9. Mohai M, Bertóti I. In ECASIA 95, Mathieu HJ, Reihl B, Briggs D (Eds). Wiley: Chichester, 1995; 675-678.
10. Mohai M. XPS MultiQuant for Windows User's Manual. Budapest, 2003; http://www.chemres.hu/aki/XMQpages/XMQhome.htm.
11. Tougaard S. J. Vacuum Science Technol. A 1996; 14: 1415; (http://www.quases.com).
12. Bertóti I, Tóth A, Mohai M, Kelly R, Marietta G. Thin Solid Films 1994; 241: 211.
13. Bertóti I, Tóth A, Mohai M, Kelly R, Marietta G. Nucl. Instrum. Methods B 1996; 116: 200.
14. Kiss É, Tóth A, Bertóti I, Marek T, Szeles Cs, Süvegh K, Vértes A, Lynn KG. In ECASIA'99 Abstracts. Sanz JM, Espinós JP (Eds). Sevilla, 1999; 336.
15. Mohai M, Kiss É, Tóth A, Szalma J, Bertóti I. Surf. Interface Anal. 2002; 34: 772.
16. Sastry M, Ganguly P, Badrinarayanan S, Mandale AB, Sainkar SR, Paranjape DV, Patil KR, Chaudhary SK. J. Appl. Phys. 1991; 70: 7073.
17. Briggs D, Seah MP. Practical Surface Analysis, Volume 1: Auger and X-ray Photoelectron Spectroscopy. Wiley: Chichester, 1990; 244-248.
18. Rivière JC, Myhra S. Handbook of Surface and Interface Analysis, Marcel Dekker: New York, 1998; 201-205.
19. Seah MP, Dench WA. Surf. Interface Anal. 1979; 1:2.
20. Jablonski A. Surf. Interface Anal. 1993; 20: 317.
21. Powell CJ, Jablonski A. NIST Electron Inelastic-Mean-Free-Path Database - Version 1.1. National Institute of Standards and Technology: Gaithersburg, MD, 2000.
22. Ebel H, Ebel MF, Jablonski A. J. Electron Spectrosc. Relat. Phenom. 1985; 35: 155.
23. Hanke W, Ebel H, Ebel MF, Jablonski A, Hirokawa K. J. Electron Spectrosc. Relat. Phenom. 1986; 40: 241.