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Volumn 116, Issue 31, 2012, Pages 16806-16813

A straightforward method for interpreting XPS data from core-shell nanoparticles

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC DIAMETER; CORE-SHELL MATERIALS; CORE-SHELL NANOPARTICLES; DIRECT METHOD; IN-SHELL; OVERLAYERS; SHELL THICKNESS; STRAIGHT-FORWARD METHOD; XPS DATA;

EID: 84865004925     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp305267d     Document Type: Article
Times cited : (120)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.