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Applied Surface Science

Volumn 173, Issue 1-2, 2001, Pages 134-139

Estimation of the average dimensions of deposited clusters from XPS emission intensity ratios

(3) Yang, D Q a Meunier, M a Sacher, E a

a ÉCOLE POLYTECHNIQUE DE MONTRÉAL (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTROMAGNETIC WAVE EMISSION; ESTIMATION; METALLIZING; PARTICLE SIZE ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPOSITED CLUSTERS;

SURFACE CHEMISTRY;

EID: 0034832076 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(00)00895-3 Document Type: Article

Times cited : (37)

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