Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2013, Pages

  Raghavan, N ^a,b   Degraeve, R ^a   Fantini, A ^a   Goux, L ^a   Strangio, S ^a   Govoreanu, B ^a   Wouters, D J ^a,b   Groeseneken, G ^a,b   Jurczak, M ^a  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Conductive filament; Constriction; Oxygen vacancy; Quantum point contact; Thermochemical model; Trap Detrap; Variability

Indexed keywords

CONDUCTIVE FILAMENTS; CONSTRICTION; QUANTUM POINT CONTACT; THERMOCHEMICAL MODELS; TRAP-DETRAP; VARIABILITY;

DIELECTRIC MATERIALS; OXYGEN VACANCIES; QUANTUM CHEMISTRY;

RANDOM ACCESS STORAGE;

EID: 84881008017     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2013.6532042     Document Type: Conference Paper

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