Nanoscale charge transport and internal structure of bulk heterojunction conjugated polymer/fullerene solar cells by scanning probe microscopy

Journal of Physical Chemistry C

Volumn 112, Issue 18, 2008, Pages 7241-7249

  Dante, Mark ^a   Peet, Jeffrey ^b   Nguyen, Thuc Quyen ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERNAL STRUCTURES; PHASE SEGREGATION; POWER CONVERSION EFFICIENCIES;

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; ESTERS; FULLERENES; HOLE MOBILITY; SOLAR CELLS; SURFACE TOPOGRAPHY;

CONJUGATED POLYMERS;

EID: 43949139253     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp712086q     Document Type: Article

References (70)

1. (a) Gong, X.; Soci, C.; Yang, C.; Heeger, A. J.; Xiao, S. J. Phys. D: Appl. Phys. 2006, 39, 2048-2052.
2. (b) Scharber, M. C.; Muehlbacher, D.; Koppe, M.; Denk, P.; Waldauf, C.; Heeger, A. J.; Brabec, C. J. Adv. Mater. 2006, 18, 789-794.
3. (c) Chiesa, M.; Buergi, L.; Kim, J.-S.; Shikler, R.; Friend, R. H.; Sirringhaus, H. Nano Lett. 2005, 5, 559-563.
4. (d) Simon, D. T.; Stanislowski, D. B.; Carter, S. A. Appl. Phys. Lett. 2007, 90, 103508.
5. (e) Pel, Q. B.; Yu, G.; Zhang, C.; Yang, Y.; Heeger, A. J. Science 1995, 269, 1086.
6. (f) Gao, J.; Dane, J. Appl. Phys. Lett. 2003, 83, 3027.
7. (a) Padinger, F.; Rittberger. R.S.; Sariciftci, N.S. Adv. Funct. Mater. 2003, 13, 85.
8. (b) Li, G.; Shrotriya, V.; Yao, Y.; Yang, Y. J. Appl. Phys. 2005, 98, 043704.
9. (c) Ma, W.; Yang, C.; Gong, X.; Lee, K.; Heeger, A. J. Adv. Funct. Mater. 2005, 15, 1617-1622.
10. (d) De Bettingnies, R.; Leroy, J.; Firon, M.; Sentein, C. Synth. Met. 2006, 156, 510-513.
11. (e) Al-Ibrahim, M.; Roth, H.-K.; Zhokhavets, U.; Gobsch, G.; Sensfuss, S. Sol. Energy Mater. Sol. Cells 2005, 85, 13-20.
12. (a) Coakley, K. M.; McGehee, M. D. Chem. Mater. 2004, 16, 4533-4542.
13. (b) Brabec, C. J.; Sariciftci, N. S.: Hummelen, J. C. Adv. Funct. Mater. 2001, 11, 15-26.
14. (c) Sun, S.; Fan, Z.; 19 Wang, Y.; Haliburton, J. J. Mater. Sci. 2005, 40, 1429-1443.
15. (d) Yoo, S.; Domercq, B.; Kippelen, B. Appl. Phys. Lett. 2004, 85, 5427-5429.
16. (e) Xue, J.; Uchida, S.; Rand, B.; Forrest, S. R. Appl. Phys. Lett. 2004, 84, 3013-3015.
17. (f) Kim, Y.; Cook, S.; Choulis, S. A.; Nelson, J.; Durrant, J. R.; Bradley, D. C. C. Chem. Mater. 2004, 16, 4812-4818.
18. (a) Shikler, R.; Chiesa, M.; Friend, R. H. Macromolecules 2006, 39, 5393-5399.
19. (b) Yao, Y.; Shi, C.; Li, G.; Shrotriya, V.; Pei, Q.; Yang, Y. Appl. Phys. Lett. 2006, 89, 153507/1-153507/3.
20. Chirvase, D.; Parisi, J.; Hummelen, J. C; Dyakonov, V. Nanotechnology 2004, 15, 1317.
21. Saraciftci, N. S.; Smilowitz. L.; Heeger, A. J.; Wudl, F. Science 1992, 258, 1474.
22. Ma, W.; Yang, C.; Gong, X.; Lee, K.; Heeger, A. J. Adv. Funct. Mater. 2005, 15, 1617.
23. Li, G.; Shrotriya, V.; Huang, J. S.; Yao, Y.; Moriarty, T.; Emery, K.; Yang, Y. Nat. Mater. 2005, 4, 864.
24. (a) Hoppe, H.; Sariciftci, N. S. J. Mater. Chem. 2006, 16, 45.
25. (b) Yang, X. N.; Loos, J.; Veenstr, S. C.; Verhees, W. J. H.; Wienk, M. M.; Kroon, J. M.; Michels, M. A. J.; Janssen, R. A. J. Nano Lett. 2005, 5, 579.
26. (c) Moses, D.; Okumoto, H.; Comoretto, D.; Lee, C. H.; Heeger, A. J.; Ohnishi, T.; Noguchi, T. Synth. Met. 1997, 84, 539.
27. (d) Scully, S. R.; McGehee, M. D. J. Appl. Phys. 2006, 100, 034907/1-034907/5.
28. (a) Sirringhaus, H.; Brown, P. J.; Friend, R. H.; Nielsen, M. M.; Bechgaard, K.; Langeveld-Voss, B. M. W.; Spiering, A. J. H.; Janssen, R. A. J.; Meijer, E. W.; Herwig, P.; de Leeuw, D. M. Nature 1999, 401, 685.
29. (b) Yang, C. Y.; Soci, C.; Moses, D.; Heeger, A. J. Synth. Met. 2005, 155, 639.
30. (c) Zhokhavets, U.; Erb, T.; Hoppe, H.; Gobscti, G.; Sariciftci, N. S. Thin Solid Films 2006, 496, 679.
31. (a) Brabec, C. J.; Sariciftci, S. N. Monatsh. Chem. 2001, 132, 421-431.
32. (b) Goris, L.; Poruba, A.; Purkrt, A.; Vandewal, K.; Swinnen, A.; Haeldermans, I.; Haenan, K.; Manca, J. V.; Vanecek, M. J. Non-Cryst. Solids 2006, 352, 1656-1659.
33. (c) Mihailetchi, V. D.; Blom, P. W. M.; Hummelen, J. C.; Rispens, M. T. J. Appl. Phys. Lett. 2003, 94, 6849-6854.
34. (d) Mihailetchi, V. D.; Koster, L. J. A.; Hummelen, J. C.; Blom, P. W. M. Phys. Rev. Lett. 2004, 93, 216601.
35. Yang, R.; Garcia, A.; Korystov, D.; Mikhailovsky, A.; Bazan, G. C.; Nguyen, T.-Q. J. Am. Chem. Soc. 2006, 128, 16532-16539.
36. Lin, H.; Lin. H.-L.; Wang, S.-S.; Yu, L.-S.; Perng, G.-Y.; Chen, S.-A.; Chen, S.-H. Appl. Phys. Lett. 2002, 81, 2572.
37. (a) Coffey, D. C.; Reid, O. G.; Rodovsky, D. B.; Bartholomew, G. P.; Ginger, D. S. Nano Lett. 2007, 7, 738.
38. (b) Douheret, O.; Lutsen, L.; Swinnen, A.; Breselge, M.; Vandewal, K.; Goris, L.; Manca, J. Appl. Phys. Lett. 2007, 89, 032107.
39. (c) Leever, B. J.; Durstock, M. F.; Irwin, M. D.; Hains, A. W.; Marks, T. J.; Pingree, L. S. C.; Hersam, M. C. Appl. Phys. Lett. 2008, 92, 013302.
40. 2 = 0.35 for the polymer, and A is calculated to be around 6.03 nm.
41. The Konarka simulator has been calibrated on the basis of standard cells traced to the National Renewable Energy Laboratory. Our laboratory used an NIST-calibrated photodiode calibrated against the Konarka facility to generate a reliable calibration curve.
42. (a) Vanlaeke, P.; Swinnen, A.; Haeldermans, I.; Vanhoyland, G.; Aernouts, T.; Cheyns, D.; Deibel, C.; D'Haen, J.; Heremans, P.; Poortmans, J.; Manca, J. V. Sol. Energy Mater. Sol. Cells 2006, 90, 2150.
43. (b) Chirvase, D.; Parisi, J.; Hummelen, J. C.; Dyakonov, V. Nanotechnology 2004, 15, 1317.
44. (c) Brown, P. J.; Thomas, D. S.; Kohler, A.; Wilson, J. S.; Kim, J.-S. Phys. Rev. B 2003, 67, 064203.
45. (d) Klimov, E.; Li, W.; Yang, X.; Hoffmann, G. G.; Loos, L. Macromolecules 2006, 39, 4493-4496.
46. Campoy-Quiles, M.; Ferenczi, T.; Agostinelli, T.; Etchegoin, P. G.; Kim, Y.; Anthopoulos, T. D.; Stavrinou, P. N.; Bradley, D. D. C.; Nelson, J. Nat. Mater. 2008, 7, 158-164.
47. (a) Hall, J. J. M.; Friend, R. H. Synth. Met. 1997, 85, 1307.
48. (b) Markov, D. E.; Amsterdam, E.; Blom, P. W. M.; Sieval, A. B.; Hummelen, J. C. J. Phys. Chem. A 2005, 109, 5266.
49. (c) Lewis, A. J.; Ruseckas, A.; Gaudin, O. P. M.; Webster, G. R.; Burn, P. L.; Samuel, I. D. W. Org. Electron. 2006, 7, 452.
50. (d) Scully, S. R.; McGehee, M. D. J. Appl. Phys. 2006, 100, 034907.
51. (a) Hoppe, H.; Niggemann, M.; Winder, C.; Kraut, J.; Hiesgen, R.; Hinsch, A.; Meissner, D.; Sariciftci, N. S. Adv. Funct. Mater. 2004, 14, 1005-1011.
52. (b) Hoppe, H.; Glatzel, T.; Niggerman, M.; Schwinger, W.; Schaeffler, F.; Hinsch, A.; Lux-Steiner, M. Ch; Sariciftci, N. S. Thin Solid Films 2006, 511-512, 587-592.
53. Steuerman, D. W.; Garcia, A.; Dante, M.; Yang, R.; Löfvander, J. P.; Nguyen, T.-Q. Adv. Mater. 2008, 20, 528-534.
54. Savenije, T. J.; Kroeze. J. E.; Yang, X.; Loos, J. Adv. Funct. Mater. 2005, 15, 1260.
55. Peet, J.; Kim, J. Y.; Coates, N. E.; Ma, W. L.; Moses, D.; Heeger, A. J.; Bazan, G. C. Nat. Mater. 2007, 6, 497-500.
56. (a) Mott, N. F.; Gurney, R. W. Electronic Processes in Ionic Crystals; Oxford University Press: London, 1948.
57. (b) Blom, P. W. M.; de Jong, M. J. M.; van Munster, M. G. Phys. Rev. B 1997, 55, R656.
58. (c) Bozano, L.; Carter, S. A.; Scott, J. C.; Malliaras, G. G.; Brock, P. J. Appl. Phys. Lett. 1999, 74, 1132.
59. Campbell, I. H.; Smith, D. L.; Neef, C. J.; Ferraris, J. P. Appl. Phys. Lett. 1999, 74, 2809.
60. Kim, Y.; Cook, S.; Tuladhar, S. M.; Choulis, S. A.; Nelson, J,; Durrant, J. R.; Bradley, D. D. C.; Giles, M.; McCulloch, I.; Ha, C.-S.; Ree, M. Nat. Mater. 2006, 5, 197-203.
61. (a) Cho, S.; Yuen, J.; Kim, J. Y.; Lee, K.; Heeger A. J. Proc. SPIE-Int. Soc. Opt. Eng. 2006, 63360/1-63360/10.
62. (b) Savenjie, T. J.; Kroeze. J. E.; Yang, X. Loos, J. Thin Solid Films 2006, 511-512, 2-6.
63. (c) Breeze, A. J.; Rumbles, G.; Gregg, B. A.; Ginley, D. S. Proc. SPIE-Int. Soc. Opt. Eng. 2004, 5215, 271.
64. (a) Al-Ibrahim, M.; Ambacher, O.; Sensfuss, S.; Gobsch, G. Appl. Phys. Lett. 2005, 86, 201120.
65. (b) Kim, Y.; Choulis, S. A.; Nelson, J.; Bradley, D. D. C.; Cook, S.; Durrant, J. R. Appl. Phys. Lett. 2005, 86, 063502.
66. (c) Chirvasem, D.; Parisi, J.; Hummelen, J. C.; Dyakonov, V. Nanotechnology 2004, 15, 1317.
67. (a) Mihailetchi, V. D.; Xie, H.; de Boer, B.; Koster, J. A. L.; Blom, P. W. M. Adv. Funct. Mater. 2006, 699-708.
68. (b) Mihailetchi, V. D.; Xie, H.; de Boer, B.; Popescu, L. M.; Hummelen, J. C.; Blom, P. W. M. Appl. Phys. Lett. 2006, 59, 012107.
69. (c) Li, G.; Shrotriya, V.; Yao, Y.; Huang, J.; Yang, Y. J. Mater. Chem. 2007, 17, 3126-3140.
70. (d) Douhéret, O.; Swinnen, A.; Breselge, M.; Van, Severen, I.; Lutsen, L.; Vanderzande, D.; Manca, J. Microelectron. Eng. 2007, 84, 431-436.