Nanoelectronic properties of a model system and of a conjugated polymer: A study by kelvin probe force microscopy and scanning conductive torsion mode microscopy

Journal of Physical Chemistry C

Volumn 114, Issue 15, 2010, Pages 7161-7168

  Sun, Ling ^a   Wang, Jianjun ^a   Bonaccurso, Elmar ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMECHANICAL PROPERTY; ELECTRONIC INDUSTRIES; GOLD NANOPARTICLES; KELVIN PROBE FORCE MICROSCOPY; MATRIX; MECHANICAL ROBUSTNESS; MODEL SYSTEM; NANOSCALE MORPHOLOGY; PEDOT:PSS; POLYSTYRENE FILMS; SUB-100 NM; THIN POLYSTYRENE FILMS; TORSION MODE;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; ELECTRONIC PROPERTIES; MATERIALS PROPERTIES; MECHANICAL PROPERTIES; MORPHOLOGY; NANOPARTICLES; PLASTIC FILMS; POLYMER BLENDS; POLYSTYRENES; PROBES; TORSIONAL STRESS;

CONJUGATED POLYMERS;

EID: 77951099112     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp1008797     Document Type: Article

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