Nanoscale PtSi tips for conducting probe technologies

IEEE Transactions on Nanotechnology

Volumn 8, Issue 1, 2009, Pages 128-131

  Bhaskaran, Harish ^a   Sebastian, Abu ^a   Despont, Michel ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

Conducting probes; Nanoscale conduction; Nanoscale wear

Indexed keywords

AMORPHOUS CARBON; AMORPHOUS SILICON; HEAT CONDUCTION; NANOSTRUCTURED MATERIALS; PLATINUM; PROBES; SILICIDES; SILICON;

CONDUCTING PROBES; NANOMETRIC; NANOSCALE CONDUCTION; NANOSCALE WEAR; PROBE TECHNOLOGIES; TETRAHEDRAL AMORPHOUS CARBONS; TIP APICES; WEAR MEASUREMENTS; WEAR PROPERTIES;

NANOTECHNOLOGY;

EID: 59049089373     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2008.2005199     Document Type: Article

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