메뉴 건너뛰기




Volumn 358, Issue 17, 2012, Pages 2545-2547

Conductive atomic force microscopy on carbon nanowalls

Author keywords

Carbon nanowalls; Conductive atomic force microscopy; Nanostructures; Torsion resonance mode

Indexed keywords

AFM; AMPLITUDE OF OSCILLATION; CARBON NANOWALLS; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CONTACT MODES; FINE STRUCTURES; IMAGING MODES; NON-CONTACT; PHASE SIGNALS; RESONANCE MODE;

EID: 84865722514     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2011.12.094     Document Type: Conference Paper
Times cited : (13)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.