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Volumn 358, Issue 17, 2012, Pages 2545-2547
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Conductive atomic force microscopy on carbon nanowalls
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Author keywords
Carbon nanowalls; Conductive atomic force microscopy; Nanostructures; Torsion resonance mode
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Indexed keywords
AFM;
AMPLITUDE OF OSCILLATION;
CARBON NANOWALLS;
CONDUCTIVE ATOMIC FORCE MICROSCOPY;
CONTACT MODES;
FINE STRUCTURES;
IMAGING MODES;
NON-CONTACT;
PHASE SIGNALS;
RESONANCE MODE;
CARBON;
NANOSTRUCTURES;
TORSIONAL STRESS;
ATOMIC FORCE MICROSCOPY;
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EID: 84865722514
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2011.12.094 Document Type: Conference Paper |
Times cited : (13)
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References (13)
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