SCOPUS 정보 검색 플랫폼

Volumn 4, Issue 8, 2012, Pages 2705-2712

Nanoscale investigation of the electrical properties in semiconductor polymer-carbon nanotube hybrid materials

(8) Desbief, Simon a Hergué, Noémie a,b Douhéret, Olivier a Surin, Mathieu a Dubois, Philippe a Geerts, Yves b Lazzaroni, Roberto a Leclère, Philippe a

a UNIVERSITY OF MONS (Belgium)

b UNIVERSITÉ LIBRE DE BRUXELLES (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT SENSING; NANO SCALE; NANOMETRES; NANOTUBE HYBRID MATERIALS; POLY (3-HEXYLTHIOPHENE); SCANNING PROBE MICROSCOPY TECHNIQUES; SINGLE CARBON NANOTUBE; TIME-RESOLVED;

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; HYBRID MATERIALS; MORPHOLOGY; NANOTECHNOLOGY; POLYMERS;

ELECTRIC PROPERTIES;

EID: 84859368199 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c2nr11888b Document Type: Article

Times cited : (46)

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