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Volumn 17, Issue 3, 2007, Pages 472-478

A Kelvin probe force microscopy study of the photogeneration of surface charges in all-thiophene photovoltaic blends

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DEFECTS; ELECTRONS; POLYMER BLENDS; PROBES; SINGLE CRYSTALS;

EID: 33847058111     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.200600122     Document Type: Article
Times cited : (69)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.