Wavelength dependence of nanoscale photodegradation in poly(3- octylthiophene) thin films

Polymer Degradation and Stability

Volumn 96, Issue 7, 2011, Pages 1279-1285

  Lopez Elvira E ^a,b   Escasain E ^a   Baro A ^b   Colchero, J ^a   Palacios Lidon E ^a  

^a UNIVERSITY OF MURCIA   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Conducting polymers; Kelvin probe microscopy; Optical microscopy; Photodegradation

Indexed keywords

BLUE LIGHT; CONTACT POTENTIAL; DEGRADATION PROCESS; ELECTRO-OPTICAL PROCESS; IRRADIATION WAVELENGTH; KELVIN PROBE MICROSCOPY; NANO SCALE; OPTICAL DENSITIES; PHOTOINDUCED PROCESS; POLY(3-OCTYLTHIOPHENE); RAMAN SPECTRA; WAVELENGTH DEPENDENCE; WORKING LIFE;

CONDUCTING POLYMERS; CONDUCTIVE FILMS; IRRADIATION; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; OPTICAL CORRELATION; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; ORGANIC CONDUCTORS; PROBES; RAMAN SPECTROSCOPY; THIN FILMS;

PHOTODEGRADATION;

EID: 79957838859     PISSN: 01413910     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymdegradstab.2011.04.002     Document Type: Article

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