Mapping of local conductivity variations on fragile nanopillar arrays by scanning conductive torsion mode microscopy

Nano Letters

Volumn 10, Issue 4, 2010, Pages 1194-1197

  Weber, Stefan A L ^a   Haberkorn, Niko ^b   Theato, Patrick ^b,c   Berger, Rüdiger ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

^c Seoul National University   (South Korea)

Author keywords

Anodized aluminum oxide template; Conductive scanning force microscopy; Nanopillar array; Organic semiconductor

Indexed keywords

ANODIZED ALUMINUM OXIDE; CONDUCTIVITY VARIATION; CURRENT IMAGE; ELECTRICAL BIAS; NANO-PILLAR ARRAYS; NANOPILLARS; NANOSCALE CHARACTERIZATION; NON DESTRUCTIVE; ORGANIC SEMICONDUCTOR; SAMPLE SURFACE; SCANNING FORCE MICROSCOPY; SPACE-CHARGE LIMITED CONDUCTION; TOPOGRAPHY IMAGING; TORSION MODE; TRIPHENYL AMINES; VOLTAGE CHARACTERISTICS;

ALUMINUM; LITHIUM BATTERIES; SCANNING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; TORSIONAL STRESS;

ALUMINA;

ALUMINUM OXIDE; ANILINE DERIVATIVE; NANOTUBE;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SURFACE PROPERTY;

ALUMINUM OXIDE; ANILINE COMPOUNDS; ELECTRIC CONDUCTIVITY; MATERIALS TESTING; MICROSCOPY, ELECTRON, SCANNING; NANOTECHNOLOGY; NANOTUBES; SEMICONDUCTORS; SURFACE PROPERTIES;

EID: 77951080099     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl9035274     Document Type: Article

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