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Volumn 113, Issue 21, 2013, Pages

GaN/VO2 heteroepitaxial p-n junctions: Band offset and minority carrier dynamics

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE MEASUREMENTS; COLLECTIVE PHENOMENA; ELECTRICAL MEASUREMENT; EXPERIMENTAL REALIZATIONS; FREQUENCY-DEPENDENT CAPACITANCE; KELVIN FORCE MICROSCOPY; MINORITY CARRIER LIFETIMES; P-N HETEROJUNCTIONS;

EID: 84879357366     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4807922     Document Type: Article
Times cited : (42)

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