Hall carrier density and magnetoresistance measurements in thin-film vanadium dioxide across the metal-insulator transition

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 15, 2009, Pages

  Ruzmetov, Dmitry ^a   Heiman, Don ^b   Claflin, Bruce B ^c   Narayanamurti, Venkatesh ^a   Ramanathan, Shriram ^a  

^a HARVARD UNIVERSITY   (United States)

^b NORTHEASTERN UNIVERSITY   (United States)

^c WRIGHT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67650514247     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.153107     Document Type: Article

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