Epitaxial variants of VO2 thin films on complex oxide single crystal substrates with 3m surface symmetry

Journal of Crystal Growth

Volumn 364, Issue , 2013, Pages 74-80

  Wong, Franklin J ^a   Zhou, You ^a   Ramanathan, Shriram ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; LATTICE MISMATCH; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; OXIDE FILMS; OXIDE MINERALS; SEMICONDUCTOR INSULATOR BOUNDARIES; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS; ZINC; ZINC OXIDE;

DIFFRACTOMETRY; ELECTRICAL TRANSPORT CHARACTERISTICS; FILM ORIENTATIONS; LARGE LATTICE MISMATCH; PLANE SYMMETRY; ROTATIONAL AXES; STOICHIOMETRIC PHASIS; SURFACE SYMMETRY;

CRYSTAL SYMMETRY;

EID: 84888352622     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2012.11.054     Document Type: Article

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