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Volumn 85, Issue 8, 2013, Pages 3955-3960

In situ TEM and energy dispersion spectrometer analysis of chemical composition change in ZnO nanowire resistive memories

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS OF CHEMICAL COMPOSITION; ENERGY DISPERSION SPECTROMETERS; IN SITU TRANSMISSION ELECTRON MICROSCOPY (TEM); LOW-RESISTANCE STATE; NON-VOLATILE MEMORY; RESISTANCE SWITCHING; RESISTIVE RANDOM ACCESS MEMORY (RERAM); STRUCTURE EVOLUTION;

EID: 84876217075     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac303528m     Document Type: Article
Times cited : (39)

References (50)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.