One nanometer resolution electrical probe via atomic metal filament formation

Nano Letters

Volumn 11, Issue 1, 2011, Pages 231-235

  Hong, Seung Sae ^a   Cha, Judy J ^b   Cui, Yi ^a  

^a STANFORD UNIVERSITY   (United States)

^b Stanford University   (United States)

Author keywords

Advanced probe; Atomic metal filament; Resistive switching; Scanning probe microscopy

Indexed keywords

ADVANCED PROBE; AFM; AFM TIP; AMBIENT CONDITIONS; ATOMIC METAL FILAMENT; CONDUCTIVE ATOMIC FORCE MICROSCOPY; ELECTRICAL PROBES; ELECTRONIC SIGNALS; HIGH RESOLUTION; INSULATING MATRIX; LATERAL RESOLUTION; METAL FILAMENTS; METALLIC FILAMENTS; NANOMETER RESOLUTIONS; RESISTIVE SWITCHING; SCANNING PROBES; TIP GEOMETRY;

ATOMIC FORCE MICROSCOPY; METALS; NANOPROBES; SCANNING; SWITCHING SYSTEMS;

PROBES;

CARBON NANOTUBE; METAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; SENSITIVITY AND SPECIFICITY; ULTRASTRUCTURE;

EQUIPMENT DESIGN; METALS; MICROSCOPY, ATOMIC FORCE; NANOTUBES, CARBON; SENSITIVITY AND SPECIFICITY;

EID: 79751499743     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl103603v     Document Type: Article

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