Formation and instability of silver nanofilament in Ag-based programmable metallization cells

ACS Nano

Volumn 4, Issue 9, 2010, Pages 5414-5420

  Hsiung, Chang Po ^a   Liao, Hsin Wei ^a   Gan, Jon Yiew ^a   Wu, Tai Bo ^a   Hwang, Jenn Chang ^a   Chen, Frederick ^b   Tsai, Ming Jinn ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Auger spectrometry; conductive filament; electrochemical cell; Rayleigh instability; resistance switching; scanning electron microscopy; TiO2; transmission electron microscopy

Indexed keywords

AUGER SPECTROMETRY; CONDUCTIVE FILAMENTS; RAYLEIGH INSTABILITY; RESISTANCE SWITCHING; SCANNING ELECTRONS; TIO; TRANSMISSION ELECTRON;

AUGERS; ELECTROCHEMICAL CELLS; ELECTROLYTIC CELLS; ELECTRONS; FILAMENTS (LAMP); PLATINUM; RAYLEIGH SCATTERING; SCANNING ELECTRON MICROSCOPY; SILVER; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY;

STABILITY;

EID: 77957323466     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn1010667     Document Type: Article

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