-
1
-
-
41149099157
-
Who Wins the Nonvolatile Memory Race?
-
Meijer, G. I. Who Wins the Nonvolatile Memory Race? Science 2008, 319, 1625-1626
-
(2008)
Science
, vol.319
, pp. 1625-1626
-
-
Meijer, G.I.1
-
2
-
-
42049103709
-
Magnetic Domain-Wall Racetrack Memory
-
Parkin, S. S. P.; Hayashi, M.; Thomas, L. Magnetic Domain-Wall Racetrack Memory Science 2008, 320, 190-194
-
(2008)
Science
, vol.320
, pp. 190-194
-
-
Parkin, S.S.P.1
Hayashi, M.2
Thomas, L.3
-
3
-
-
35748985544
-
Phase-Change Materials for Rewriteable Data Storage
-
Wuttig, M.; Yamada, N. Phase-Change Materials for Rewriteable Data Storage Nat. Mater. 2007, 6, 824-832
-
(2007)
Nat. Mater.
, vol.6
, pp. 824-832
-
-
Wuttig, M.1
Yamada, N.2
-
4
-
-
35748974883
-
Nanoionics-Based Resistive Switching Memories
-
Waser, R.; Aono, M. Nanoionics-Based Resistive Switching Memories Nat. Mater. 2007, 6, 833-840
-
(2007)
Nat. Mater.
, vol.6
, pp. 833-840
-
-
Waser, R.1
Aono, M.2
-
5
-
-
43549126477
-
Resistive Switching in Transition Metal Oxides
-
Sawa, A. Resistive Switching in Transition Metal Oxides Mater. Today. 2008, 11, 28-36
-
(2008)
Mater. Today.
, vol.11
, pp. 28-36
-
-
Sawa, A.1
-
6
-
-
33847759058
-
Conductive Bridging RAM (CBRAM): An Emerging Non-volatile Memory Technology Scalable to Sub 20 nm
-
Kund, M.; Beitel, G.; Pinnow, C.-U.; Röhr, T.; Schumann, J.; Symanczyk, R.; Ufert, K.-D.; Müller, G. Conductive Bridging RAM (CBRAM): An Emerging Non-volatile Memory Technology Scalable to Sub 20 nm IEDM Tech. Dig. 2005, 773-776
-
(2005)
IEDM Tech. Dig.
, pp. 773-776
-
-
Kund, M.1
Beitel, G.2
Pinnow, C.-U.3
Röhr, T.4
Schumann, J.5
Symanczyk, R.6
Ufert, K.-D.7
Müller, G.8
-
7
-
-
77952933126
-
NiO Resistive Random Access Memory Nanocapacitor Array on Graphene
-
Son, J. Y.; Shin, Y.-H.; Kim, H.; Jang, H. M. NiO Resistive Random Access Memory Nanocapacitor Array on Graphene ACS Nano 2010, 4, 2655-2658
-
(2010)
ACS Nano
, vol.4
, pp. 2655-2658
-
-
Son, J.Y.1
Shin, Y.-H.2
Kim, H.3
Jang, H.M.4
-
8
-
-
65249161894
-
Electrical Manipulation of Nanofilaments in Transition-Metal Oxides for Resistance-Based Memory
-
Lee, M.-J.; Han, S.; Jeon, S. H.; Park, B. H.; Kang, B. S.; Ahn, S.-E.; Kim, K. H.; Lee, C. B.; Kim, C. J.; Yoo, I.-K. Electrical Manipulation of Nanofilaments in Transition-Metal Oxides for Resistance-Based Memory Nano Lett. 2009, 9, 1467-1481
-
(2009)
Nano Lett.
, vol.9
, pp. 1467-1481
-
-
Lee, M.-J.1
Han, S.2
Jeon, S.H.3
Park, B.H.4
Kang, B.S.5
Ahn, S.-E.6
Kim, K.H.7
Lee, C.B.8
Kim, C.J.9
Yoo, I.-K.10
-
9
-
-
43049126833
-
The Missing Memristor Found
-
Strukov, D. B.; Snider, G. S.; Stewart, D. R.; Williams, R. S. The Missing Memristor Found Nature 2008, 453, 80-83
-
(2008)
Nature
, vol.453
, pp. 80-83
-
-
Strukov, D.B.1
Snider, G.S.2
Stewart, D.R.3
Williams, R.S.4
-
10
-
-
61649104641
-
Programmable Resistance Switching in Nanoscale Two-Terminal Devices
-
Jo, S. H.; Kim, K.-H.; Lu, W. Programmable Resistance Switching in Nanoscale Two-Terminal Devices Nano Lett. 2009, 9, 469-500
-
(2009)
Nano Lett.
, vol.9
, pp. 469-500
-
-
Jo, S.H.1
Kim, K.-H.2
Lu, W.3
-
11
-
-
46749093701
-
Memristive Switching Mechanism for Metal/Oxide/Metal Nanodevices
-
Yang, J. J.; Pickett, M. D.; Li, X.; Ohlberg, D. A. A.; Stewart, D. R.; Williams, R. S. Memristive Switching Mechanism for Metal/Oxide/Metal Nanodevices Nat. Nanotechnol. 2008, 3, 429-433
-
(2008)
Nat. Nanotechnol.
, vol.3
, pp. 429-433
-
-
Yang, J.J.1
Pickett, M.D.2
Li, X.3
Ohlberg, D.A.A.4
Stewart, D.R.5
Williams, R.S.6
-
12
-
-
0015127532
-
Memristor-The Missing Circuit Element
-
Chua, L. O. Memristor-The Missing Circuit Element IEEE Trans. Circuit Theory 1971, 18, 507-519
-
(1971)
IEEE Trans. Circuit Theory
, vol.18
, pp. 507-519
-
-
Chua, L.O.1
-
13
-
-
77950852717
-
'Memristive' Switches Enable 'Stateful' Logic Operations via Material Implication
-
Borghetti, J.; Snider, G. S.; Kuekes, P. J.; Yang, J. J.; Stewart, D. R.; Williams, R. S. 'Memristive' Switches Enable 'Stateful' Logic Operations via Material Implication Nature 2010, 464, 873-876
-
(2010)
Nature
, vol.464
, pp. 873-876
-
-
Borghetti, J.1
Snider, G.S.2
Kuekes, P.J.3
Yang, J.J.4
Stewart, D.R.5
Williams, R.S.6
-
14
-
-
77951026760
-
Nanoscale Memristor Device as Synapse in Neuromorphic Systems
-
Jo, S. H.; Chang, T.; Ebong, I.; Bhadviya, B. B.; Mazumder, P.; Lu, W. Nanoscale Memristor Device as Synapse in Neuromorphic Systems Nano Lett. 2010, 10, 1297-1301
-
(2010)
Nano Lett.
, vol.10
, pp. 1297-1301
-
-
Jo, S.H.1
Chang, T.2
Ebong, I.3
Bhadviya, B.B.4
Mazumder, P.5
Lu, W.6
-
15
-
-
77951576344
-
Learning Abilities Achieved by a Single Solid-State Atomic Switch
-
Hasegawa, T.; Ohno, T.; Terabe, K.; Tsuruoka, T.; Nakayama, T.; Gimzewski, J. K.; Aono, M. Learning Abilities Achieved by a Single Solid-State Atomic Switch Adv. Mater. 2010, 22, 1831-1834
-
(2010)
Adv. Mater.
, vol.22
, pp. 1831-1834
-
-
Hasegawa, T.1
Ohno, T.2
Terabe, K.3
Tsuruoka, T.4
Nakayama, T.5
Gimzewski, J.K.6
Aono, M.7
-
16
-
-
67349281548
-
Study of Multilevel Programming in Programmable Metallization Cell (PMC) Memory
-
Russo, U.; Kamalanathan, D.; Ielmini, D.; Lacaita, A. L.; Kozicki, M. N. Study of Multilevel Programming in Programmable Metallization Cell (PMC) Memory IEEE Trans. Electron Device Lett. 2009, 56, 1040-1047
-
(2009)
IEEE Trans. Electron Device Lett.
, vol.56
, pp. 1040-1047
-
-
Russo, U.1
Kamalanathan, D.2
Ielmini, D.3
Lacaita, A.L.4
Kozicki, M.N.5
-
17
-
-
65249125383
-
Fully Room-Temperature-Fabricated Nonvolatile Resistive Memory for Ultrafast and High-Density Memory Application
-
Yang, Y. C.; Pan, F.; Liu, Q.; Liu, M.; Zeng, F. Fully Room-Temperature-Fabricated Nonvolatile Resistive Memory for Ultrafast and High-Density Memory Application Nano Lett. 2009, 9, 1636-1643
-
(2009)
Nano Lett.
, vol.9
, pp. 1636-1643
-
-
Yang, Y.C.1
Pan, F.2
Liu, Q.3
Liu, M.4
Zeng, F.5
-
19
-
-
76449096940
-
Nanoscale Resistive Memory with Intrinsic Diode Characteristics and Long Endurance
-
053106
-
Kim, K.-H.; Jo, S. H.; Gaba, S.; Lu, W. Nanoscale Resistive Memory with Intrinsic Diode Characteristics and Long Endurance Appl. Phys. Lett. 2010, 96 053106
-
(2010)
Appl. Phys. Lett.
, vol.96
-
-
Kim, K.-H.1
Jo, S.H.2
Gaba, S.3
Lu, W.4
-
20
-
-
49149126998
-
Role of Structural Defects in the Unipolar Resistive Switching Characteristics of Pt/NiO/Pt Structures
-
042102
-
Park, C; Jeon, S. H.; Chae, S. C.; Han, S.; Park, B. H.; Seo, S.; Kim, D.-W. Role of Structural Defects in the Unipolar Resistive Switching Characteristics of Pt/NiO/Pt Structures Appl. Phys. Lett. 2008, 93 042102
-
(2008)
Appl. Phys. Lett.
, vol.93
-
-
Park, C.1
Jeon, S.H.2
Chae, S.C.3
Han, S.4
Park, B.H.5
Seo, S.6
Kim, D.-W.7
-
21
-
-
33749356243
-
Influence of Oxygen Content on Electrical Properties of NiO Films Grown by RF Reactive Sputtering for Resistive Random-Access Memory Applications
-
Park, J.-W.; Park, J.-W.; Jung, K.; Yang, M. K.; Lee, J.-K. Influence of Oxygen Content on Electrical Properties of NiO Films Grown by RF Reactive Sputtering for Resistive Random-Access Memory Applications J. Vac. Sci. Technol. B 2006, 24, 2205-2208
-
(2006)
J. Vac. Sci. Technol. B
, vol.24
, pp. 2205-2208
-
-
Park, J.-W.1
Park, J.-W.2
Jung, K.3
Yang, M.K.4
Lee, J.-K.5
-
22
-
-
34247561316
-
2 Film Memory Devices
-
2 Film Memory Devices IEEE Electron Device Lett. 2007, 28, 366-368
-
(2007)
IEEE Electron Device Lett.
, vol.28
, pp. 366-368
-
-
Lin, C.-Y.1
Wu, C.-Y.2
Wu, C.-Y.3
Lee, T.-C.4
Yang, F.-L.5
Hu, C.6
Tseng, T.-Y.7
-
23
-
-
70450245086
-
2-Based ReRAM with Implanted Ti Ions
-
2-Based ReRAM with Implanted Ti Ions IEEE Electron Device Lett. 2009, 30, 1335-1337
-
(2009)
IEEE Electron Device Lett.
, vol.30
, pp. 1335-1337
-
-
Liu, Q.1
Long, S.2
Wang, W.3
Zuo, Q.4
Zhang, S.5
Chen, J.6
Liu, M.7
-
24
-
-
67349254824
-
x Bilayer for Nonvolatile Memory Applications
-
x Bilayer for Nonvolatile Memory Applications IEEE Electron Device Lett. 2009, 30, 457-459
-
(2009)
IEEE Electron Device Lett.
, vol.30
, pp. 457-459
-
-
Yoon, J.1
Choi, H.2
Lee, D.3
Park, J.-B.4
Lee, J.5
Seong, D.-J.6
Ju, Y.7
Chang, M.8
Jung, S.9
Hwang, H.10
-
25
-
-
67650733296
-
2:Cu/Pt Device
-
023501
-
2:Cu/Pt Device Appl. Phys. Lett. 2009, 95 023501
-
(2009)
Appl. Phys. Lett.
, vol.95
-
-
Liu, Q.1
Dou, C.2
Wang, Y.3
Long, S.4
Wang, W.5
Liu, M.6
Zhang, M.7
Chen, J.8
-
26
-
-
60749127336
-
2-Based Resistive Switching Cells: Overcoming the Voltage-Time Dilemma of Electrochemical Metallization Memories
-
072109
-
2-Based Resistive Switching Cells: Overcoming the Voltage-Time Dilemma of Electrochemical Metallization Memories Appl. Phys. Lett. 2009, 94 072109
-
(2009)
Appl. Phys. Lett.
, vol.94
-
-
Schindler, C.1
Staikov, G.2
Waser, R.3
-
27
-
-
67650102619
-
Redox-Based Resistive Switching Memories-Nanoionic Mechanisms, Prospects, and Challenges
-
Waser, R.; Dittmann, R.; Staikov, G.; Szot, K. Redox-Based Resistive Switching Memories-Nanoionic Mechanisms, Prospects, and Challenges Adv. Mater. 2009, 21, 2632-2663
-
(2009)
Adv. Mater.
, vol.21
, pp. 2632-2663
-
-
Waser, R.1
Dittmann, R.2
Staikov, G.3
Szot, K.4
-
30
-
-
33846024379
-
1- xS Nonvolatile Memory Devices
-
1- xS Nonvolatile Memory Devices IEEE Electron Device Lett. 2007, 28, 14-16
-
(2007)
IEEE Electron Device Lett.
, vol.28
, pp. 14-16
-
-
Wang, Z.1
Griffin, P.B.2
McVittie, J.3
Wong, S.4
McIntyre, P.C.5
Nishi, Y.6
-
32
-
-
34247536761
-
Fabrication and Charging Characteristics of MOS Capacitor Structure with Metal Nanocrystals Embedded in Gate Oxide
-
Guan, W.; Long, S.; Liu, M.; Li, Z.; Hu, Y.; Liu, Q. Fabrication and Charging Characteristics of MOS Capacitor Structure with Metal Nanocrystals Embedded in Gate Oxide J. Phys. D: Appl. Phys. 2007, 40, 2754-2758
-
(2007)
J. Phys. D: Appl. Phys.
, vol.40
, pp. 2754-2758
-
-
Guan, W.1
Long, S.2
Liu, M.3
Li, Z.4
Hu, Y.5
Liu, Q.6
-
33
-
-
77957585627
-
Diffusion of Adhesion Layer Metals Controls Nanoscale Memristive Switching
-
In press
-
Yang, J. J.; Strachan, J. P.; Xia, Q. F.; Ohlberg, D. A. A.; Kuekes, P. J.; Kelley, R. D.; Stickle, W. F.; Stewart, D. R.; Medeiros-Ribeiro, G.; Willams, R. S. Diffusion of Adhesion Layer Metals Controls Nanoscale Memristive Switching. Adv. Mater. In press.
-
Adv. Mater.
-
-
Yang, J.J.1
Strachan, J.P.2
Xia, Q.F.3
Ohlberg, D.A.A.4
Kuekes, P.J.5
Kelley, R.D.6
Stickle, W.F.7
Stewart, D.R.8
Medeiros-Ribeiro, G.9
Willams, R.S.10
|