In situ X-ray microdiffraction studies inside individual VO2 microcrystals

Acta Materialia

Volumn 61, Issue 8, 2013, Pages 2751-2762

  Budai, J D ^a   Tselev, A ^a   Tischler, J Z ^a,c   Strelcov, E ^a,b   Kolmakov, A ^b   Liu, W J ^c   Gupta, A ^d   Narayan, J ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b SOUTHERN ILLINOIS UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Interfaces; Phase transition; Synchrotron microdiffraction; Twinning

Indexed keywords

ELECTRONIC TRANSITION; INTERFACE ORIENTATION; INTERPHASE BOUNDARIES; METAL-INSULATOR PHASE TRANSITION; MICRODIFFRACTIONS; STRUCTURAL MEASUREMENTS; SUBMICRON SPATIAL RESOLUTION; SUBSTRATE-INDUCED STRAIN;

EPITAXIAL FILMS; INTERFACES (MATERIALS); MATERIALS PROPERTIES; METAL INSULATOR BOUNDARIES; MICROCRYSTALS; OXIDE MINERALS; PHASE STABILITY; PHASE TRANSITIONS; STRAIN; TWINNING; X RAYS;

X RAY DIFFRACTION;

EID: 84875411168     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2012.09.074     Document Type: Article

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