Semiconductor to metal phase transition in the nucleation and growth of VO2 nanoparticles and thin films

Journal of Applied Physics

Volumn 96, Issue 2, 2004, Pages 1209-1213

  Suh, J Y ^a   Lopez, R ^a   Feldman, L C ^a   Haglund Jr , R F ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; GRAIN GROWTH; GRAIN SIZE AND SHAPE; NUCLEATION; PHASE TRANSITIONS; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR GROWTH; SUPERCONDUCTING TRANSITION TEMPERATURE; THERMOOXIDATION; THIN FILMS; VANADIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

LATTICE DISTORTION; MONOCLINIC STRUCTURES; SEMICONDUCTOR-TO-METAL TRANSITIONS (SMT); VANADIUM DIOXIDE;

NANOSTRUCTURED MATERIALS;

EID: 3242739528     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1762995     Document Type: Article

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