Single-nanometer focusing of hard x-rays by Kirkpatrick-Baez mirrors

Journal of Physics Condensed Matter

Volumn 23, Issue 39, 2011, Pages

  Yamauchi, Kazuto ^a,b   Mimura, Hidekazu ^c   Kimura, Takashi ^a   Yumoto, Hirokatsu ^d   Handa, Soichiro ^a   Matsuyama, Satoshi ^a,b   Arima, Kenta ^a   Sano, Yasuhisa ^a   Yamamura, Kazuya ^a   Inagaki, Koji ^a   Nakamori, Hiroki ^a   Kim, Jangwoo ^a   Tamasaku, Kenji ^e   Nishino, Yoshinori ^b,f   Yabashi, Makina ^e   Ishikawa, Tetsuya ^d,e  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^e RIKEN SPring 8 Center   (Japan)

^f HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

A-SPOTS; DIFFRACTION LIMITED; HARD X RAY; IN-SITU; KIRKPATRICK-BAEZ MIRROR; MULTI-LAYER MIRRORS; NANO-FOCUSING; NANOMETER PRECISION; PHASE COMPENSATOR; PHASE ERROR; RAYLEIGH CRITERION; SPRING-8; SYNCHROTRON RADIATION BEAMLINE; WAVEFRONT ERRORS; X-RAY INTERFEROMETRY;

OPTICAL SYSTEMS; X RAYS;

MIRRORS;

EID: 80052953359     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/23/39/394206     Document Type: Review

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