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Volumn 524, Issue 1-2, 2009, Pages 3-9

At the limit of polychromatic microdiffraction

Author keywords

Laue diffraction; Mesoscale; Microbeam; Structure; X ray

Indexed keywords

AMORPHOUS SILICON; CRYSTAL STRUCTURE; DIFFRACTION; X RAY DETECTORS;

EID: 69249136594     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2009.06.001     Document Type: Article
Times cited : (25)

References (36)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.