Using compound kinoform hard-X-ray lenses to exceed the critical angle limit

Physical Review Letters

Volumn 99, Issue 13, 2007, Pages

  Evans Lutterodt, K ^a   Stein, A ^a   Ablett, J M ^a   Bozovic, N ^a,c   Taylor, A ^b   Tennant, D M ^b,d  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b NOKIA RESEARCH CENTER   (United States)

^c SAN JOSE STATE UNIVERSITY   (United States)

^d Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; OPTICS; PHOTONS;

CRITICAL ANGLE LIMIT; FOCUSING OPTICS; KINOFORM LENSES; LENS FUNCTION;

LENSES;

EID: 34848926535     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.99.134801     Document Type: Article

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