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Volumn 16, Issue 4, 2004, Pages 744-749
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Intelligent Window Coatings: Atmospheric Pressure Chemical Vapor Deposition of Tungsten-Doped Vanadium Dioxide
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
INTELLIGENT WINDOW COATINGS;
ATMOSPHERIC PRESSURE;
TUNGSTEN;
UNCLASSIFIED DRUG;
VANADIUM;
VANADIUM DIOXIDE;
ARTICLE;
ATMOSPHERIC PRESSURE;
CHEMICAL ANALYSIS;
CHEMICAL COMPOSITION;
CHEMICAL REACTION;
FILM;
RAMAN SPECTROMETRY;
REACTION ANALYSIS;
REFLECTOMETRY;
SCANNING ELECTRON MICROSCOPY;
TEMPERATURE DEPENDENCE;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 1242297695
PISSN: 08974756
EISSN: None
Source Type: Journal
DOI: 10.1021/cm034905y Document Type: Article |
Times cited : (398)
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References (24)
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