A superbend X-ray microdiffraction beamline at the advanced light source

Materials Science and Engineering: A

Volumn 524, Issue 1-2, 2009, Pages 28-32

  Tamura, N ^a   Kunz, M ^a   Chen, K ^a   Celestre, R S ^a   MacDowell, A A ^a   Warwick, T ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Laue diffraction; Microprobe; Strain stress measurements; X ray beamline; X ray microdiffraction

Indexed keywords

INTERFEROMETRY; LIGHT SOURCES; SUPERCONDUCTING MAGNETS;

ADVANCED LIGHT SOURCE; BEAM-LINES; LAUE DIFFRACTION; MICRO-PROBES; MONOCHROMATIC RADIATION; STRAIN/STRESS MEASUREMENT; STRESSES MEASUREMENTS; SUPERBENDS; X RAY MICRODIFFRACTION; X-RAY BEAMLINES;

DIFFRACTION PATTERNS;

EID: 69249125293     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2009.03.062     Document Type: Article

References (12)

1. Mimura H., Yumoto H., Matsuyama S., Sano Y., Yamamura K., Mori Y., Yabashi M., Nishino Y., Tamasaku K., Ishikawa T., and Yamauchi K. Appl. Phys. Lett. 90 5 (2007) 059103
2. Hignette O., Cloetens P., Rostaing G., Bernard P., and Morawe C. Rev. Sci. Instrum. 76 6 (2005) 063709
3. Liu W.J., Ice G.E., Tischler J.Z., Khounsary A., Liu C., Assoufid L., and Macrander A.T. Rev. Sci. Instrum. 76 11 (2005) 113701
4. A P Hammersley, FIT2D: An Introduction and Overview, ESRF Internal Report, ESRF97HA02T, 1997.
5. Larson B.C., Yang W., Ice G.E., Budai J.D., and Tischler J.Z. Nature 415 (2002) 887
6. Tamura N., MacDowell A.A., Spolenak R., Valek B.C., Bravman J.C., Brown W.L., Celestre R.S., Padmore H.A., Batterman B.W., and Patel J.R. J. Synchrotron Radiat. 10 2 (2003) 137-143
7. Hartmann J. Z. Instrumentenkunde 20 (1900) 47
8. Budiman A.S., Nix W.D., Tamura N., Valek B.C., Gadre K., Maiz J., Spolenak R., and Patel J.R. Appl. Phys. Lett. 88 (2006) 233515
9. Gilbert P., Metzler R.A., Zhou D., Scholl A., Doran A., Young A., Kunz M., Tamura N., and Coppersmith S.N. J. Am. Chem. Soc. 130 (2008) 17519-17527
10. K. Chen, N. Tamura, K.-N. Tu Materials Research Society Symposium Proceedings, 1116E (2009) I05-06.
11. Sciau P., Goudeau P., Tamura N., and Dooryhee E. Appl. Phys. A-Mater. Sci. Process. 83 2 (2006) 219-224
12. Y. Leon, Ph. Sciau, Ph. Goudeau, N. Tamura, S. Webb, A. Mehta, The nature of marbled Terra Sigillata Slips: A combined μXRF and μXRD investigations, J. Phys A., in press.