A new white beam x-ray microdiffraction setup on the BM32 beamline at the European Synchrotron Radiation Facility

Review of Scientific Instruments

Volumn 82, Issue 3, 2011, Pages

  Ulrich, O ^a   Biquard, X ^a   Bleuet, P ^a   Geaymond, O ^b   Gergaud, P ^a   Micha, J S ^a   Robach, O ^a   Rieutord, F ^a  

^a CEA GRENOBLE   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC PROCEDURES; BEAM CONDITIONING; BEAM DIFFRACTION; BEAM LINES; BEAM SIZE; BENDING MAGNET SOURCE; DEMAGNIFICATION; EUROPEAN SYNCHROTRON RADIATION FACILITIES; FAST READOUT; HYDROSTATIC STRAIN; LARGE APERTURE; MICRODIFFRACTIONS; OPTICAL MICROSCOPES; POLYCRYSTALLINE SAMPLES; STRAIN MAPPING; SUBMICROMETERS; WHITE BEAMS; X RAY MICRODIFFRACTION;

SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY DIFFRACTION;

DIFFRACTION;

EID: 79953658278     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3555068     Document Type: Article

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