Deformation modes of nanostructured thin film under controlled biaxial deformation

Thin Solid Films

Volumn 530, Issue , 2013, Pages 30-34

  Djaziri, S ^a   Faurie, D ^b   Le Bourhis, E ^a   Goudeau, Ph ^a   Renault, P O ^a   Mocuta, C ^c   Thiaudiere D ^c   Hild, F ^d  

^a CNRS   (France)

^b UNIVERSITÉ PARIS 13   (France)

^c SYNCHROTRON SOLEIL   (France)

^d Grande Voie des Vignes   (France)

Author keywords

Biaxial deformation; Digital image correlation; Elastic limit; Nanostructured W Cu thin films; Synchrotron X ray diffraction

Indexed keywords

BIAXIAL DEFORMATIONS; DIGITAL IMAGE CORRELATIONS; ELASTIC LIMIT; NANO-STRUCTURED; SYNCHROTRON X RAY DIFFRACTION;

DEFORMATION; IMAGE ANALYSIS; POLYIMIDES; STRAIN; STRAIN MEASUREMENT; SUBSTRATES; SYNCHROTRON RADIATION; TENSILE TESTING; THIN FILMS; X RAY DIFFRACTION;

INTERFACES (MATERIALS);

EID: 84874761767     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.05.051     Document Type: Conference Paper

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