Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector

Journal of Applied Crystallography

Volumn 45, Issue 1, 2012, Pages 38-47

  Le Bourlot, C ^a,d   Landois, P ^b   Djaziri, S ^c   Renault, P O ^c   Le Bourhis, E ^c   Goudeau, P ^c   Pinault, M ^e   Mayne Lhermite, M ^e   Bacroix, B ^a   Faurie, D ^a   Castelnau, O ^d   Launois, P ^b   Rouzire, S ^b  

^a UNIVERSITÉ PARIS 13   (France)

^b UNIVERSITÉ PARIS SUD   (France)

^c UNIVERSITÉ DE POITIERS   (France)

^d CNRS   (France)

^e CEA SACLAY   (France)

Author keywords

calibration; pixel area detectors; synchrotron X ray diffraction

Indexed keywords

AREA DETECTORS; CORRECTION PROCEDURE; DIFFRACTION IMAGES; DIRECT BEAMS; DUPLEX STEELS; ELASTIC-PLASTIC DEFORMATION; FAST READOUT; HIGH DYNAMIC RANGE; HIGH QUALITY; HIGH SIGNAL-TO-NOISE RATIO; HYBRID PIXEL DETECTORS; MECHANICAL CHARACTERIZATIONS; NANOSTRUCTURED MULTILAYERS; SAMPLE-TO-DETECTOR DISTANCE; SCIENTIFIC RESULTS; SYNCHROTRON X-RAY DIFFRACTION;

CALIBRATION; CARBON NANOTUBES; COMMUNICATION CHANNELS (INFORMATION THEORY); EXPERIMENTS; FADING (RADIO); MULTILAYERS; PIXELS; SIGNAL TO NOISE RATIO; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY DIFFRACTION;

DETECTORS;

EID: 84855934644     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811049107     Document Type: Article

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