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Volumn 493, Issue 1-2, 2008, Pages 267-273

Effect of length scale on fatigue life and damage formation in thin Cu films

Author keywords

Cracking; Cu; Fatigue; Interface; Length scale; Thin film

Indexed keywords

CRACKS; EXTRUSION; FILM THICKNESS; INTERFACES (MATERIALS); METALLIC FILMS; TENSILE STRENGTH; TENSILE TESTING; THIN FILMS; YIELD STRESS;

EID: 49849089853     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2007.06.092     Document Type: Article
Times cited : (90)

References (29)
  • 2
    • 0032500424 scopus 로고    scopus 로고
    • Arzt E. Acta Mater. 46 (1998) 5611-5626
    • (1998) Acta Mater. , vol.46 , pp. 5611-5626
    • Arzt, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.