Study of texture effect on elastic properties of Au thin films by X-ray diffraction and in situ tensile testing

Acta Materialia

Volumn 54, Issue 17, 2006, Pages 4503-4513

  Faurie, D ^a   Renault, P O ^a   Le Bourhis, E ^a   Goudeau, Ph ^a  

^a CNRS   (France)

Author keywords

Elastic behavior; Tension test; Texture; Thin films; X ray diffraction (XRD)

Indexed keywords

ELASTIC MODULI; GOLD; GONIOMETERS; STRAIN; SYNCHROTRON RADIATION; TENSILE TESTING; TEXTURES; X RAY DIFFRACTION ANALYSIS;

ELASTIC BEHAVIOR; GOLD FILMS; MECHANICAL COUPLING; STRAIN ANALYSIS;

THIN FILMS;

EID: 33748319560     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.05.036     Document Type: Article

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