Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data

Applied Physics Letters

Volumn 83, Issue 3, 2003, Pages 473-475

  Renault, P O ^a   Le Bourhis, E ^a   Villain, P ^a   Goudeau, Ph ^a   Badawi, K F ^a   Faurie, D ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELASTICITY; GOLD; SUBSTRATES; TEXTURES; X RAY DIFFRACTION ANALYSIS;

ELASTIC CONSTANTS;

THIN FILMS;

EID: 0042126833     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1594280     Document Type: Article

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