In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation

Journal of Applied Crystallography

Volumn 42, Issue 6, 2009, Pages 1073-1084

  Faurie, D ^a   Castelnau, O ^a   Brenner, R ^a   Renault, P O ^b   Le Bourhis, E ^b   Goudeau, Ph ^b  

^a UNIVERSITÉ PARIS 13   (France)

^b UNIVERSITÉ DE POITIERS   (France)

Author keywords

Gold thin films; Micromechanical models; Strain analysis; Synchrotron radiation

Indexed keywords

EID: 70449835509     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889809037376     Document Type: Article

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