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Volumn 77, Issue 10, 2006, Pages

Development and validation of an experimental setup for the biaxial fatigue testing of metal thin films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FAILURE (MECHANICAL); FATIGUE TESTING; METALLIC FILMS; MICROOPTICS; SCANNING ELECTRON MICROSCOPY;

EID: 33750523272     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2357313     Document Type: Conference Paper
Times cited : (16)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.