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Volumn 77, Issue 10, 2006, Pages
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Development and validation of an experimental setup for the biaxial fatigue testing of metal thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FAILURE (MECHANICAL);
FATIGUE TESTING;
METALLIC FILMS;
MICROOPTICS;
SCANNING ELECTRON MICROSCOPY;
BIAXIAL FATIGUE TESTING;
POLYMER SUBSTRATES;
RING-ON-RING TESTS;
THIN FILMS;
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EID: 33750523272
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2357313 Document Type: Conference Paper |
Times cited : (16)
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References (16)
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