Practical aspects of single-pass scan Kelvin probe force microscopy

Review of Scientific Instruments

Volumn 83, Issue 11, 2012, Pages

  Li, Guangyong ^a   Mao, Bin ^a   Lan, Fei ^a   Liu, Liming ^a  

^a University of Pittsburgh   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; KELVIN PROBE FORCE MICROSCOPY; OPERATION MODE; PRACTICAL GUIDANCE; SCANNING PARAMETERS; SPATIAL RESOLUTION; TIP APEX; TOPOGRAPHICAL IMAGES;

CROSSTALK; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; MEASUREMENT ERRORS; OPTICAL TRANSFER FUNCTION;

PROBES;

EID: 84870508828     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4761922     Document Type: Article

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