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Technical Physics Letters

Volumn 35, Issue 6, 2009, Pages 573-576

Direct observation of minority carrier leakage in operating laser diodes by Kelvin probe force microscopy

(3) Ladutenko, K S a Ankudinov, A V a Evtikhiev, V P a

a IOFFE INSTITUTE (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70349754353 PISSN: 10637850 EISSN: None Source Type: Journal
DOI: 10.1134/S1063785009060261 Document Type: Article

Times cited : (2)

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